陆华;李扬武;岳增记;曾为;

• 1:西北工业大学物理科学与技术学院
• 2:伍伦贡大学超导和电子材料研究所
• 3:西北工业大学材料学院

摘要(Abstract)：

采用椭偏法测量了拓扑绝缘体Bi_2Te_3单晶的复折射率.运用经典的德鲁德和托克-洛伦兹模型分别对拓扑绝缘体的表面态和体态进行拟合,获得了其折射率和消光系数,并且分析了色散曲线的变化规律.实验结果表明:Bi_2Te_3拓扑绝缘体的体态具有类半导体特性(含带隙),折射率在近红外波段可达7以上;表面态具有类金属特性,厚度约为2.52nm.

关键词(KeyWords)： 椭偏法;拓扑绝缘体;Bi_2Te_3;复折射率;消光系数

Abstract:

Keywords:

基金项目(Foundation): 国家自然科学基金项目(No.11974283,11774290,61705186);; 陕西省自然科学基础研究计划项目(No.2020JM-130)

作者(Author): 陆华;李扬武;岳增记;曾为;

Email:

DOI: 10.19655/j.cnki.1005-4642.2021.01.004

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